Join us in Orlando, FL for the SPIE Defense + Commercial Sensing conference and exhibition April 5-7, 2022!
We’ll have a live demonstration of freeform metrology that is fast, full aperture and high resolution. With our GuideStar alignment references, CGH usability is significantly easier than ever before. AOM can even provide complete metrology systems to relate test part datums to CGH optical features for a complete turnkey metrology system.
Complex optical surface production is streamlined with CGH-enabled precision metrology – affordable, easy to use and fast delivery!
Hope to see you in Orlando!